IEC 62321-5-2013 pdf free download

IEC 62321-5-2013 pdf free download.Determination of certain substances in electrotechnical products – Part 5: Cadmium, lead and chromium in polymers and electronics and cadmium and lead in metals by AAS, AFS, ICP-OES and ICP-VS.
IEC 62321-5 refers to the sample as the ob.ct to be processed and measured. What the sample is or how to get to the sample is defined by the entity carrying out the tests Further guidance on obtaining representative samples from finished electronic products to be tested for levels of regulated substances may be found in IEC 62321-2. II is noted that the selection andior determination oP me sample may affect the Interpretation of the test results.
This standard desczibes the use of four methods, namely AAS (atomic absorption spectrometry). AFS (atomic fluorescence spectrometry), ICP-OES (inductively coupled plasma optical emission spectrometry), and ICPMS (inductively coupled plasma mass spectromelry) as well as several procedures for preparing the sample solution from which the most appropriate method of analysis can be selected by experts.
As the hexavalent-Cr analysis Is sometimes difficult to determine In polymers and electronics, this standard introduces thi scre•ning methods for chrome In polymers and •lictronlcs except from AFS. Chromium analysis provides information about the existenCe of hexavalentCr in materials. However, elemental analyses cannot selectively detect hexavalertt•Cr: it determines the amount of Cr in all oxidation states in the samples It Cr amounts exceed the hexavalent•Cr limit, testing for hexavalent-Cr should be performed.
The test procedures described in this standard are intended to provide the highest level of accuracy and precision for concentrations of Pb, Cd and Cr that range, in the case of ICPOES and AAS, from 10 mglLg for Pb. Cd and Cr. in the case of ICP-MS, from 0.1 mg)tg for Pb and Cd in the case of AFS, th, range as from 10 mg’kg for Pb and 1.5 mg/ltg for Cd. The procedures are not limited for higher concentrations.
This standard does not apply to materials containing polyfluorinated polymers because of their stability. It sulfuric acid Is used in the analytical procedure, there is a risk of losing Pb, thus resulting in erroneously low values for this analyte. In addition, sulfuric acid and hydrofluoric acid are not suitable tor determining Cd by AFS. because it disturbs the reduction of Cd.
Limitations and risks occur due to the solution step of the sample, e.g. prcipltation of the target or other elements may occur. In which case the residues have to be checked separately or dissolved by another method and then Combined with the test sample solution.
2 Normative references
Th. following documents. in whole o in part, are normatively referenced in this document and are indispensable tot Its application. For dated r.t.ences, only the edition cited applies. For undated references, the latest edition of the referenced document (Including any amendm,nts appI.es
IEC 62321 -1, Determrnation 01 certain substances in &ectrotechrncal products — Pan I: Introduction and overview
IEC 62321-2, Determination of certain substances in lectrotechnical products — Part 2: Disassembly, disjointment and mechanical sample preparation
IEC 62321-3-1, Determination of certain sLlbstances En eiectrotechrncal products — Pan 3: Screening — Lead. mercury. cadmium, total chrom,um and total bromine using X-ray fluorescence spectrometry
ISO 3696. Water lot analytical laboratory use — Spec’Iicalion and test methods ISO 5961. Water quality — Determination of cadmium by atomic absorption spectrometry
3 Terms, defInItions and abbreviations
3.1 Terms and definitIons
For the purposes oP this document, the terms and delinhllons given in IEC 82321.1, as well as the following, apply.IEC 62321-5 pdf free download